DDI 칩 테스트 데이터 분석용 맵 알고리즘

Analytic Map Algorithms of DDI Chip Test Data

  • 황금주 (충북대학교 전자공학과) ;
  • 조태원 (충북대학교 전기전자컴퓨터 공학부)
  • Hwang Kum-Ju (Electronic Engineering, Chungbuk National University) ;
  • Cho Tae-Won (School of Electronic & Computer Engineering, Chungbuk National University)
  • 발행 : 2006.03.01


One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.