• Title/Summary/Keyword: DDI(Display Driver IC)

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Functional verification method of OLED driver IC using PLI (PLI를 이용한 OLED 드라이버 IC의 기능 검증 방법)

  • Kim, Jung-Hak;Kim, Seok-Yoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.44 no.6
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    • pp.83-88
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    • 2007
  • In this paper, we propose the function verification method of the OLED(Organic Light Emitting Diode) drive IC using PLI verification method. This method uses the HDL(Hardware Description Language) simulator, PLI(Programing Language Interface), and GUI (Graphic User Interface) image viewer. This method improves the execute efficiency 40 times than conventional function verification methods. The proposed method can be used efficiently for function verification of DDI(display driver IC) design step.

Analytic Map Algorithms of DDI Chip Test Data (DDI 칩 테스트 데이터 분석용 맵 알고리즘)

  • Hwang Kum-Ju;Cho Tae-Won
    • Journal of the Semiconductor & Display Technology
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    • v.5 no.1
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    • pp.5-11
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    • 2006
  • One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.

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