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Analytic Map Algorithms of DDI Chip Test Data (DDI 칩 테스트 데이터 분석용 맵 알고리즘)

  • Hwang Kum-Ju;Cho Tae-Won
    • Journal of the Semiconductor & Display Technology
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    • v.5 no.1
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    • pp.5-11
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    • 2006
  • One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.

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