Fast 3-dimensional profifle measurement using slit-ray projection method

  • Ishimatsu, T. (Department of Mechanical Engineering, Nagasaki University) ;
  • Kawasue, K. (Department of Mechanical Engineering, Nagasaki University) ;
  • Kumon, K. (Department of Mechanical Engineering, Nagasaki University)
  • Published : 1987.10.01

Abstract

This paper describes a systein which enables a fast 3 -dimensional profile measurement using a slit-ray projection method. One distinctive feature of this system is that a real-time video is processor is employed in order to reduce the amount of image data to be processed without eliminating essential information. Experimental results show that a calibrating method presented for the TV camera and the slit-ray projector is convenient and enables sufficient accurate measurements.

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