Fabrication and evaluation of NSOM apparatus

NSOM장치의 제작 및 특성 평가

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  • A.K. Viswanath ;
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  • 이주인 (한국표준과학연구원 양자표준부) ;
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  • 유성규 (한국표준과학연구원 양자표준부) ;
  • 신정규 (광주과학기술원 정보통신공학과) ;
  • 유필원 (광주과학기술원 정보통신공학과)
  • Published : 1999.12.01

Abstract

W made a near-field optical microscope(NSOM) apparatus and evaluated it. To control the distance between a tip and a sample, we used a piezoelectric translator and a He-Ne laser, and consequently obtained the spatial resolution better than 100nm. For the semiconductor spectroscopic applications, we performed photoluminescence and photocurrent experiments on the GaAs/AlGaAs MQWs samples. In the case of PL experiment, we obtained the low signal to nose ration due to the extremely small power of a light source passing through the nanometric optical fiber tip. However photocurrent experiment shows a hundred times better signal to noise than that of PL experiment. This suggests that photocurrent experiment using NSOM have the possibility to provide the spatial resolution better than 10nm.

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