세라미스트 (Ceramist)
- 제2권1호
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- Pages.41-48
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- 1999
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- 1226-976X(pISSN)
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- 2586-0631(eISSN)
최신 TEM 분석법에 의한 재료의 미세구조 해석
Microstructure Analysis of Materials by Recent Transmission Electron Microscopy
- Park, Gyeong-Su (Samsung Advanced Institute of Technology) ;
- Park, Min-Woo (Dept. of Materials Engineering, Kyungsung University)
- 발행 : 1999.02.28