Temperature Dependence of Excitonic Transitions in GaN Grown by MOCVD

  • Guangde Chen (Department of Applied Physics, Xi′an Jiaotong University, Xi′an 710049, P. R. China) ;
  • Jingyu Lin (Department of Physics, Kansas State University, Kansas 66506, USA) ;
  • Hongxing Jiang (Department of Physics, Kansas State University, Kansas 66506, USA) ;
  • Kim, Jung-Hwan (Department of Physics, Dongeui University) ;
  • Park, Sung-Eul (Department of Physics, University of Inchon)
  • Published : 2000.03.01

Abstract

The Photoluminescence (PL) measurement results of a very good quality GaN sample grown by metalorganic chemical vapor deposition (MOCVD) are reported. The temperature dependences of peak position, emission intensity, and the full width at half maximum (FWHM) of free-exciton (FX) A and B are presented. Our results show the fast thermal quenching of FX transition intensities and predominantly acoustic phonon scattering of emission line broadening. The transition-energy-shift following the Varshni's empirical equation, and by using it to fit the data, E$\_$A1/(T) = 3.4861 eV -6.046 $\times$ 10$\^$-4/T$^2$ (620.3+ T) eV, E$\_$B1/(T) = 3.4928 eV -4.777 $\times$ 10$\^$-4/T$^2$ / (408.2+ T) eV and E$\_$A2/ = 3.4991 eV -4.426 $\times$ 10$\^$-4/ T$^2$ / (430.6+ T) eV for A(n=1), B(n=1), and A(n=2) are obtained respectively.

Keywords

References

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