DOI QR코드

DOI QR Code

AFM Study and Magnetic Properties of Nanocrystalline Fe73.5-xCrxSi13.5B9Nb3Au1 (x=1~5) Alloys

  • Le, Anh-Than (Department of Materials Engineering, Chungnam National University) ;
  • Chau Nguyen (Center for Materials Science, National University of Hanoi) ;
  • Cuong Nguyen Duy (Department of Materials Engineering, Chungnam National University) ;
  • The Ngo Duc (Center for Materials Science, National University of Hanoi) ;
  • Kim, Chong-Oh (Department of Materials Engineering, Chungnam National University) ;
  • Rhee, Jang-Roh (Department of Physics, Sookmyung Womens University) ;
  • Lee, Hee-Bok (Department of Physics Education, Kongju National University)
  • Published : 2006.03.01

Abstract

In this paper, the influences of microstructural and surface morphological developments on the soft magnetic properties and giant magneto-impedance (GMI) effect of the $Fe_{73.5-x}Cr_{x}Si_{13.5}B_{9}Nb_{3}Au_1$ (x = 1, 2, 3, 4, 5) alloys have been presented. It was found that the Cr addition slightly decreased the mean grain size of $\alpha-Fe(Si)$ grains. AFM results indicate a large variation of surface morphology of density and size of protrusions along the ribbon plane due to microstructural changes caused by thermal annealing with increasing Cr content. Ultrasoft magnetic properties of the nanocrystallized samples were noticeably enhanced by properly heat treatments at $T_a=540^{\circ}C$ such as an increase of the magnetic permeability and the decrease of coercivity, which is likely due to the formation of nanoscale $\alpha-Fe(Si)$ phase which reduced the magnetoelastic anisotropy of samples. Accordingly, the GMI effect was observed in the annealed samples. The correlation between the microstructure, surface morphology, and soft magnetic properties were explained by nucleation and growth model.

Keywords

References

  1. M. E. McHenry, M. A. Willard, and D. E. Laughlin, Prog. Mater. Sci. 44, 291 (1999) https://doi.org/10.1016/S0079-6425(99)00002-X
  2. Y. Yoshizawa, S. Oguma, and K. Yamauchi, J. Appl. Phys. 64, 6044 (1988) https://doi.org/10.1063/1.342149
  3. P. Martin, M. Lopez, A. Hernando, Y. Iqbal, H. A. Davies, and M. R. J. Gibbs, J. Appl. Phys. 92, 374 (2002) https://doi.org/10.1063/1.1485109
  4. R. Alben, J. J. Becker, and M. C. Chi, J. Appl. Phys. 49, 1653 (1978) https://doi.org/10.1063/1.324881
  5. G. Herzer, IEEE. Trans. Magn. 25, 3327 (1989) https://doi.org/10.1109/20.42292
  6. U. Koster, Mater. Sci. Eng. 97, 233 (1988) https://doi.org/10.1016/0025-5416(88)90049-3
  7. A. Gupta, and S. Habibi, Mater. Sci. Eng. A. 133, 375 (1991) https://doi.org/10.1016/0921-5093(91)90091-Z
  8. A. Slawska-Waniewska, A. Witck, and A. Reich, Mater. Sci. Eng. A. 133, 363 (1991) https://doi.org/10.1016/0921-5093(91)90088-5
  9. A. K. Panda, M. Manimaran, A. Mitra, and S. Basu, Appl. Surf. Sci. 235, 475 (2004) https://doi.org/10.1016/j.apsusc.2004.03.254
  10. S. H. Lim, W. K. Pi, T. H. Noh, H. J. Kim, and I. K. Kang, J. Appl. Phys. 73, 6591 (1993) https://doi.org/10.1063/1.352574
  11. C. G. Polo, P. Martin, L. Pascual, A. Hernando, and M. Vazquez, Phys. Rev B. 65, 24433 (2001) https://doi.org/10.1103/PhysRevB.65.024433
  12. M. H. Phan, H. X. Peng, S. C. Yu, N. D. Tho, and N. Chau, Acta. Mater (submitted)
  13. P. Agudo, and M. Vazquez, J. Appl. Phys. 97, 23901 (2005) https://doi.org/10.1063/1.1825633
  14. C. G. Polo, et al., J. Magn. Magn. Mater. 290, 1517 (2005) https://doi.org/10.1016/j.jmmm.2004.11.564
  15. N. Chau, N. Q. Hoa, and N. H. Luong, J. Magn. Magn. Mater. 290, 1547 (2005) https://doi.org/10.1016/j.jmmm.2004.11.245
  16. Heebok Lee, Y. K. Kim, K. J. Lee, and T. K. Kim, J. Magn. Magn. Mater. 215, 310 (2000) https://doi.org/10.1016/S0304-8853(00)00143-8
  17. M. H. Phan, H. X. Peng, M. R. Wiscom, S. C. Yu, and N. Chau, Composites, Part A (inpress)
  18. B. D. Cullity, Elements of X-ray diffraction, 2nd Ed, Addison-Wesley Publishing Company, Inc., Reading, MA (1978), pp. 102
  19. J. D. Ayers, V. G. Harris, J. A. Sprague, and W. T. Elam, J. Appl. Phys. 64, 974 (1994)
  20. V. M. Prida, P. Gorria, G. V. Kurlyandskaya, M. L. Sanchez, B. Hernando, and M. Tejedor, Nanotechnology. 14, 231 (2003) https://doi.org/10.1088/0957-4484/14/2/325
  21. M. H. Phan, H. X. Peng, M. R. Wiscom, S. C. Yu, and N. Chau, Phys. Status Solidi A 201, 1558 (2004) https://doi.org/10.1002/pssa.200306791
  22. L. V. Pannia, K. Mohri, T. Uchiyama, and M. Noda, IEEE Trans. Magn. 31, 1249 (1995) https://doi.org/10.1109/20.364815