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Test tool for flow and self-leveling characters of coating materials of siloxane polymer used to semiconductor and electronic parts

반도체와 전자 부품에 사용되는 실록산 고분자 코팅물질의 흐름성 및 자기 퍼짐성 측정 시험장치 연구

  • Kim, Cheol-Hyun (Department of Chemistry and Medical Chemistry, Yonsei University) ;
  • Cho, Hyeon-Mo (Department of Chemistry and Medical Chemistry, Yonsei University) ;
  • Lee, Myong-Euy (Department of Chemistry and Medical Chemistry, Yonsei University)
  • 김철현 (연세대학교 과학기술대학 화학 및 의화학과) ;
  • 조현모 (연세대학교 과학기술대학 화학 및 의화학과) ;
  • 이명의 (연세대학교 과학기술대학 화학 및 의화학과)
  • Received : 2012.03.14
  • Accepted : 2012.04.05
  • Published : 2012.04.25

Abstract

A test tool for self-leveling and flowing characters of coating materials used to semiconductors and electronic parts, especially for protection of LCD and PDP connectors, was designed, and the test tool was evaluated using polymeric siloxane coating materials which have various viscosities. The test results showed that the designed test tool was effective to measure self-leveling and flowing properties of coating materials. Therefore, considering that the viscosity is not directly correlated with self-leveling and flowing properties, we believe that this test tool will be a very useful tool for measurement instead of classical method using viscosities of coating materials. Particularly, the measurement of self-leveling and flowing properties using the test tool would be expected to be used in the area of selecting suitable protective coating materials for LCD (Liquid Crystal Display), PDP (Plasma Display Panel) and semiconductor connection parts.

반도체와 전자부품의 코팅제로 사용되는, 특히 LCD와 PDP 커넥터주위의 보호를 위해 사용되는 폴리실록산(시편)의 흐름성(flow) 및 퍼짐성(self-leveling)을 측정할 수 있는 시험 장치가 고안되었고, 점도가 각기 다른 실록산 폴리머 견본들을 이용하여 고안된 시험장치를 시험하였다. 이 장치를 사용하여 시편의 흐름성 및 퍼짐성을 측정한 결과, 이 장치가 점도를 통해 흐름성 및 퍼짐성을 예측하던 것을 대신 할 수 있다고 판단되었다. 특히, 흐름성이 적절히 조절되어야만 하는 LCD, PDP 및 반도체 커넥션 보호 코팅제의 특성 평가에 유용하게 활용될 것으로 기대된다.

Keywords

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  1. Synthesis and Physical Property of Multi-Functional Siloxane Protective Coating Materials Applicable for Electronic Components vol.35, pp.6, 2014, https://doi.org/10.5012/bkcs.2014.35.6.1665