DOI QR코드

DOI QR Code

Surface Defect Inspection System for Hot Slabs

열간 슬라브 표면결함 탐상 시스템

  • Yun, Jong Pil (Control and Instrumentation Research Group, Engineering Solution Center, POSCO) ;
  • Jung, Daewoong (Aircraft System Technology Group, Korea Institute of Industrial Technology (KITECH)) ;
  • Park, Changhyun (Instrumentation System Group, PIBEX INC.)
  • Received : 2016.03.02
  • Accepted : 2016.06.27
  • Published : 2016.08.01

Abstract

In this paper, we propose a new vision-based defect inspection system for the surface of hot slabs. To minimize the influence of self-emission from slab surfaces with high temperature, an optic method based on blue LED light and a blue pass filter is proposed. Because the slab surface is partially covered with scales, which are unavoidable oxidized substances caused during manufacturing, it is difficult to distinguish between vertical cracks and scale. In order to resolve this problem and to improve the detection performance, the use of a Gabor filter and dynamic programming are proposed. Finally, the effectiveness of the proposed method is shown by means of experiments conducted on images of hot slabs that were obtained from an actual slab production line.

Keywords

References

  1. H.-S, Kim, K.-J, Lee, D.-Y. Jung, Y-H. Lee, J.-H. Park, and G.-S. Kim, "Design for a defect product inspection device for the curved glass used in smart-phone," Journal of Institute of Control, Robotics and Systems (in Korean), vol. 21, no. 8, pp. 794-800, 2015. https://doi.org/10.5302/J.ICROS.2015.15.0049
  2. Y. J. Jang and J. S. Lee, "Development of a 3D shape reconstruction system for defects on a hot steel surface," Journal of Institute of Control, Robotics and Systems (in Korean), vol. 21, no. 5, pp. 459-464, 2015. https://doi.org/10.5302/J.ICROS.2015.14.0147
  3. Y. H. Tseng and D. M. Tsai, "Defect detection of uneven brightness in low-contrast images using basis image representation," Pattern Recognition, vol. 43, no. 3, pp. 1129-1141, 2010. https://doi.org/10.1016/j.patcog.2009.09.006
  4. W. C. Li and D. M. Tsai "Wavelet-based detect detection in solar wafer images with inhomogeneous texture," Pattern Recognition, vol. 45, no. 2, pp. 742-756, Feb. 2012. https://doi.org/10.1016/j.patcog.2011.07.025
  5. H. Liu, W. Zhou, Q. Kuang, L. Cao, and B. Cao, "Defect detection of IC wafer based on spectral subtraction," IEEE Trans. Semiconductor Manufacturing, vol. 23, no. 1, pp. 141-147, Feb. 2010. https://doi.org/10.1109/TSM.2009.2039185
  6. J. S. Lee, S.-W. Choi, and G. H. Kim, "Development of a magnetic sensor for internal defect detection in steel sheets," Proceeding of the 27th Conference Control, Robotics and System, pp. 331-332, Apr. 2012.
  7. Y. J. Jean, D. C. Choi, J. P. Yun, and S. W. Kim, "Detection of periodic defects using dual-light switching lighting method on the surface of thick plates," ISlJ International, vol. 55, no. 9, pp. 1942-1949, Sep. 2015.
  8. J. P. Yun, D. C. Choi, Y. J. Jean, C. H. Park, and S. W. Kim, "Defect inspection. system for steel wire rods produced by hot rolling process," International Journal of Advanced Manufacturing Technology, vol. 70, no. 9, pp. 1625-1634, Feb. 2014. https://doi.org/10.1007/s00170-013-5397-8
  9. S.-G Ryu, Y.-J, Jean, D.-C. Choi, S. J. Lee, J. P. Yun, and S. W. Kim, "Detection of scarfing faults on the edges of slabs," ISlJ International, vol. 55, no. 9, pp. 1942-1949, Sep. 2015.
  10. A. Kumar and G. K. H. Pang, "Detection detection in textured materials using Gabor filters," IEEE Trans. on Industry Applications, vol. 38, no. 2, pp. 425-440, Mar. 2002. https://doi.org/10.1109/28.993164
  11. S.-W. Lee, D.-J. Lee, and H.-S. Park, "A new methodology for gray-scale character segmentation and recognition," IEEE Pattern, Analysis and Machine Intelligence, vol. 18, no. 10, pp. 1045-1050, Oct 1996. https://doi.org/10.1109/34.541415