Abstract
Recently, advance in technology have increased the importance of visual inspection in semiconductor inspection areas. In PCB visual inspection, accurate line estimation is critical to the accuracy of the entire process, since it is utilized in preprocessing steps such as calibration and alignment. We propose a line estimation method that is differently weighted for the line candidates using a histogram of gradient information, when the position of the initial approximate corner points is known. Using the obtained line equation of the outline, corner points can be calculated accurately. The proposed method is compared with the existing method in terms of the accuracy of the detected corner points. The proposed method accurately detects corner points even when the existing method fails. For high-resolution frames of 3.5mega-pixels, the proposed method is performed in 89.01ms.