반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)

한국반도체디스플레이기술학회 (The Korean Society Of Semiconductor & Display Technology)
권호 표지

반도체 외장형 자체 테스트를 위한 임의 파형 생성기 구현

Implementation of an Arbitrary Waveform Generator for Built-Out Self-Test

  • 이창진 (호서대학교 전자 및 디스플레이공학부) ;
  • 김동혁 (호서대학교 전자 및 디스플레이공학부) ;
  • 안진호 (호서대학교 전자 및 디스플레이공학부)
  • Lee, Changjin (Hoseo University, School of Electronics and Display Engineering) ;
  • Kim, Donghyuk (Hoseo University, School of Electronics and Display Engineering) ;
  • Ahn, Jin-Ho (Hoseo University, School of Electronics and Display Engineering)
  • 투고 : 2021.09.05
  • 심사 : 2021.09.16
  • 발행 : 2021.09.30
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초록

We introduce an arbitrary waveform generation method and its H/W implementation case based on Rademacher and Walsh function. According to the orthogonal and periodic features of Rademacher and Walsh function, simple calculations can generate arbitrary waves with affordable logics. We implemented an FPGA-based AWS using above two functions, and verified. HDL simulation shows the proposed idea can draw desired analog test waveforms very fast, and its H/W size is promising to Built-Out Self-Test(BOST) logics for AI ICs.

키워드

과제정보

이 논문은 2019년도 정부(산업통상자원부)의 재원으로 한국연구재단-실종아동 등 신원확인을 위한 복합인지기술개발사업사업의 지원을 받아 수행된 연구임(No. 2018M3E3A1057248).

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