Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)

The Korean Society Of Semiconductor & Display Technology (한국반도체디스플레이기술학회)
권호 표지

Improvement of Signal Transfer Characteristics of Fine Pitch Probe Pin Using Coaxial Test Socket with New Structure

새로운 구조의 동축 테스트 소켓을 이용한 미세 피치 프로브 핀의 신호 전달 특성 개선

  • Jeong-Jun Seo (Graduate School of Mechatronics Engineering, Kongju National University) ;
  • Moonjung Kim (Department of Electrical Electronic and Control Engineering, Kongju National University)
  • 서정준 (공주대학교 기전공학과) ;
  • 김문정 (공주대학교 전기전자제어공학부)
  • Received : 2024.03.11
  • Accepted : 2024.03.20
  • Published : 2024.03.31
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Abstract

In this paper, the difference between the S-parameter and the characteristic impedance according to the structural change of the fine pitch coaxial socket was analyzed. A pitch of the probe pin was applied to 0.20mm, and ground pins of different conditions were placed on each of the five signal pins. Insertion loss and reflection loss were analyzed for the coaxial socket of normal structure and the two sockets of the proposed structure. In addition, the difference in characteristic impedance was analyzed using time domain reflectometry. Through the analysis, it was confirmed that the characteristic impedance was improved applying the new structures of the socket at the same pitch

Keywords

References

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